X-ray Diffraction for the Determination of Residual Stress of Crystalline Material: An Overview

Though there are a variety of experimental techniques available for residual stress measurements, diffraction-based measurements have the unique advantage estimating individual components strain matrix in crystalline material. This is then converted to stresses with appropriate continuum elasticity model(s) and X-ray elastic constants. In particular, based on electron or neutron diffractions their complexities availability issues. The laboratory diffraction, other hand, may provide an easy resource effective tool. Such range from two tilt methods more extended d-sin2ψ multiple {hkil} grazing incident diffraction. Measurements can even be conducted single crystals micro-Laue diffraction ODF (orientation distribution function) calculations. These unquestionably extremely specialized, where measurement uncertainty plays important role effectiveness plus reproducibility data. Unfortunately, standard textbooks review articles typically describe some, but not all, techniques. this overview, different determination material been summarized. It hoped that potential users benefit deliberations.